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vertical , cantilever
and MEMS probe cards
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Probe Technology Ltd.
Probe Vertical Technology
Tel: +44 (0)1355 221228 Fax: +44 (0)1355 234855 e-mail:
sales@probetechnology.co.uk
Single die up to 9000 probes, frequency up to 3GHz.
For solder or Au bumps at temperatures between -45 and +150ºC.
Vertical for flip chip
Standard vertical
High parallelism for pitches over 90 microns.
High frequency with test temperatures of -45 to +180ºC.
Pitches down to 65 microns inline and up to 64 DUT in parallel
High CCC, low contact pressure
Easy pin replacement
test temperature range of -45 to +150ºC
Fine pitch vertical