The experts in
vertical , cantilever
and MEMS probe cards
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Probe Technology Ltd.
Cantilever Technologies and Applications








Tel: +44 (0)1355 221228                        Fax: +44 (0)1355 234855                        e-mail: sales@probetechnology.co.uk
  • This technology is available for device with min pitch of 43-49 µm on two rows.

  • Controlled pressure for probe over active area POA and POP low K-pads











Helium Plus Wave












Standard Cantilever













  • Fast design, short leadtime.

  • Choice of probe materials for standard, high current and high temperature applications













  • Fine pitch inline and staggered. 

  • Controlled scrub mark and low digging.










Multi-Die
(2x2 configuration)












RF analog applications / Known good die testing














  • Testing withing final test limits.

  • Maximum frequency 2.5GHz,

  • Temperature -40 to +180ºC













  • Over 100 MHz test frequency.

  • Using co-axial cable to avoid cross talk.












High speed digital testing